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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems) Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Hardcover
Edition:
1
Alvin W. Strong
Ernest Y. Wu
Rolf-Peter Vollertsen
Jordi Sune
Giuseppe La Rosa
Timothy D. Sullivan
Stewart E. Rauch III
Publisher:
Wiley-IEEE Press
Release Date:
2009
ISBN-10:
0471731722
ISBN-13:
9780471731726
List Price: 
$211.95
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