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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing (22B)) Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing (22B))
Hardcover
Edition:
2003
Nicola Nicolici
Bashir M. Al-Hashimi
Publisher:
Springer
Release Date:
2003
ISBN-10:
140207235X
ISBN-13:
9781402072352
List Price: 
$159.99
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eBook: $49.50

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Price:
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Total:
$49.50

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$10.50
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180 Day eBook
(Expire Date 11/03/2026)
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