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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B) Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
Hardcover
Edition:
2003
Nicola Nicolici
Bashir M. Al-Hashimi
Publisher:
Springer
Release Date:
2003
ISBN-10:
140207235X
ISBN-13:
9781402072352
List Price: 
$109.99
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eBook: $49.50

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