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Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences (35)) Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences (35))
Paperback
Edition:
Softcover reprint of the original 1st ed. 1983
Author:
J. Bourgoin
Publisher:
Springer
Release Date:
2011
ISBN-10:
364281834X
ISBN-13:
9783642818349
List Price: 
$149.00
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New: $168.47

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Price:
$164.48
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Total:
$168.47
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