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On Line-Testing for VLSI On Line-Testing for VLSI
Hardcover
Edition:
Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998
Author:
On-Line Monitoring of Reliability Indicators. 4.1.
Publisher:
Springer
Release Date:
1998
ISBN-10:
0792381327
ISBN-13:
9780792381327
List Price: 
$109.99
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