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Journey to Data Quality (The MIT Press) Journey to Data Quality (The MIT Press)
Paperback
Edition:
Illustrated
Yang W. Lee
Leo L. Pipino
Richard Y. Wang
James D. Funk
Publisher:
The MIT Press
Release Date:
2009
ISBN-10:
0262513358
ISBN-13:
9780262513357
List Price: 
$25.00
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