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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Paperback
Edition:
Softcover reprint of hardcover 2nd ed. 2007
Manoj Sachdev
JosAtildecopy Pineda de Gyvez
Publisher:
Springer
Release Date:
2010
ISBN-10:
1441942858
ISBN-13:
9781441942852
List Price: 
$219.99
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