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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Hardcover
Edition:
2nd
Manoj Sachdev
JosAtildecopy Pineda de Gyvez
Publisher:
Springer
Release Date:
2007
ISBN-10:
0387465464
ISBN-13:
9780387465463
List Price: 
$219.99
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eBook: $104.50

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180 Day eBook
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