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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Hardcover
Edition:
1998
Way Kuo
Wei-Ting Kary Chien
Taeho Kim
Publisher:
Springer
Release Date:
1998
ISBN-10:
0792381076
ISBN-13:
9780792381075
List Price: 
$249.99
Cheapest Price Summary

New: $147.22

Abebooks
(Marketplace)
Price:
$140.27
Shipping:
$6.95
Total:
$147.22
Buy Nowclick here!

Cheapest Price Summary
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Abebooks
(Marketplace)
New
New $140.27
as of 1 second ago 		$6.95
$147.22
44% off $147.22Buy Nowclick here!
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